DSpace

King Saud University Repository >
King Saud University >
ACADEMIC PUBLISHING & PRESS >
Journal of the King Saud University - Agricultural Sciences >

Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1046

Title: Mathematical simulation model to predict storage time of grain
Authors: Al-Yahya, Sulaiman A.
Keywords: Corn hybrids
Mathematical simulation model
NADWIS
Moisture
Multiplier
Issue Date: 1996
Publisher: King Saud University
Citation: Journal of King Saud University, Agricultural Sciences: 8(1); 71-84
Abstract: In this study, a mathematical simulation model for grain storage was developed. The model predicts the average temperature and changes in the moisture content inside the grain storage bin during the natural aeration. The model also predicts the allowable storage time for the different type of corn hybrids (resistant and susceptible). The model can predict the previous variables for any storage year after introducing its weather data. The model is valid for just corn. It can be used for other grain types after obtaining their experimental equations of physical properties. Storage time at different conditions was estimated after calculating many multipliers such as temperature multiplier, moisture multiplier, damage multiplier, harvest multiplier, and hybrid multiplier. The program has been validated and calibrated by comparing the simulated results with the experimental field results.
Description: Department of Agricultural Engineering, College of Agriculture and Veterinary Medicine, King Saud University, Gassim Branch, Saudi Arabia
URI: http://digital.library.ksu.edu.sa/paper1688.html
http://printpress.ksu.edu.sa/research.asp?rid=1688&id=6
Appears in Collections:Journal of the King Saud University - Agricultural Sciences

Files in This Item:

File SizeFormat
Mathemtical Simulation Model to Predict Storage Time of Grain.pdf240.23 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

DSpace Software Copyright © 2002-2007 MIT and Hewlett-Packard - Feedback