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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/10734

Title: Estimation of components reliability in a parallel system using masked system life data
Authors: . Sarhan, Ammar M
Lotfi Tadj
Keywords: the reliability of the individual components
a parallel system
masked-system life test data
Issue Date: 2003
Publisher: Applied Mathematics and Computation
Citation: Volume 138, Issues 2-3, 20 June 2003, Pages 217-226
Abstract: Abstract In this paper we estimate the reliability of the individual components that belong to a parallel system using masked-system life test data. In particular, we compute the maximum likelihood and Bayes estimates of component reliabilities. The considered system consists of J independent components having non-identical complementary exponential lifetime distributions. It is assumed for Bayes estimates that the unknown parameters are independent random variables having symmetrical triangle probability density functions. The approaches are illustrated with a two-component parallel system. A numerical simulation study is introduced to show how one can use the present approaches to compute these estimations for a practical problem. Also in the numerical simulation study a comparison between Bayes and maximum likelihood estimates is introduced
URI: http://hdl.handle.net/123456789/10734
Appears in Collections:College of Science

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