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Please use this identifier to cite or link to this item:
http://hdl.handle.net/123456789/10750
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| Title: | Optimal Design of Step-Stress Life Test with Progressively type-II Censored Exponential Data |
| Authors: | . Sarhan, Ammar M |
| Keywords: | binominal distribution estimation optimal design, D-optimality , Monte Carlo Simulation |
| Issue Date: | 2009 |
| Publisher: | International Mathematical Forum |
| Citation: | 4, 2009, no. 40, 1963 - 1976 |
| Abstract: | This paper discusses step-stress partially accelerated life test under
progressive type-II censoring with random removals. The removalsfrom the test are assumed to have binomial distributions. The lifetimes of the test units are considered to be exponential distributed. The maximum likelihood procedure is
followed to estimate the unknown parameters of the model. Optimum test plan
is developed using the D-optimality criterion. Monte Carlo Simulation technique
is applied to illustrate the theoretical results discussed in this paper.
Mathematics Subject Classification: 62N05 |
| URI: | http://hdl.handle.net/123456789/10750 |
| Appears in Collections: | College of Science
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