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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/10750

Title: Optimal Design of Step-Stress Life Test with Progressively type-II Censored Exponential Data
Authors: . Sarhan, Ammar M
Keywords: binominal distribution
optimal design,
, Monte Carlo Simulation
Issue Date: 2009
Publisher: International Mathematical Forum
Citation: 4, 2009, no. 40, 1963 - 1976
Abstract: This paper discusses step-stress partially accelerated life test under progressive type-II censoring with random removals. The removalsfrom the test are assumed to have binomial distributions. The lifetimes of the test units are considered to be exponential distributed. The maximum likelihood procedure is followed to estimate the unknown parameters of the model. Optimum test plan is developed using the D-optimality criterion. Monte Carlo Simulation technique is applied to illustrate the theoretical results discussed in this paper. Mathematics Subject Classification: 62N05
URI: http://hdl.handle.net/123456789/10750
Appears in Collections:College of Science

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