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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/12813

Title: Development of metal inspection system exploiting magnetoresistive sensors
Authors: Elshafiey, I. ,
Mohra, A.
Keywords: Data compression; Electronic equipment manufacture; Finite element method; Metals; Printed circuit boards; Printed circuit manufacture; Sensitivity analysis; Sensors; Structural metals; Thick films
Issue Date: 2006
Publisher: IEEE
Citation: Proceedings - The 6th IEEE International Workshop on System on Chip for Real Time Applications, IWSOC 2006 2006, Article number 4155279, Pages 152-155
Abstract: evaluation NDE of metal structures. MR sensors include high sensitivity and reduced size. Being produced by thin film processing techniques, the manufacturing cost of these sensors is low. This paper provides an attempt to develop an NDE system that depends on one type of MR sensors, namely the giant MR (GMR) elements. An example is considered of detecting defects in printed circuit boards. System details and experimental results are provided. Computational modeling validation is introduced based on finite element analysis. © 2006 IEEE.
URI: http://hdl.handle.net/123456789/12813
ISSN: 02181266
Appears in Collections:College of Engineering

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